The application of time-of-flight secondary ion spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses.
Rutten, F.J.M., Briggs, D., Henderson, J. and Roe, M.J., — 2009
Author Rutten, F.J.M., Briggs, D., Henderson, J. and Roe, M.J.,
Date 2009
Publisher Archaeometry, 51.6: 966-986.
Location Maritime Museum
Geographic Not Geographic